DocumentCode
2377962
Title
Jitter testing for multi-Gigabit backplane SerDes - techniques to decompose and combine various types of jitter
Author
Cai, Y. ; Werner, S.A. ; Zhang, G.J. ; Olsen, M.J. ; Brink, R.D.
Author_Institution
Agere Syst. Inc., Allentown, PA, USA
fYear
2002
fDate
2002
Firstpage
700
Lastpage
709
Abstract
The recent trend for broadband backplanes is changing from bus-based architectures to fabric/mesh-based high-speed architectures. Freed from heavy loading effects of a bus, modern backplane serializers and deserializers (SerDes) soared to multi-Gigabit-per-second (Gb/s) rate. The increasing integration density, coupled with the increasing data rate, makes jitter testing more critical than ever However, the techniques for jitter testing of a multi-Gigabit backplane SerDes are different from its long haul transceiver counterparts. As specified in some leading communication standards, such as Gigabit Ethernet, Infiniband, and Fiber Channel, jitter is specified in terms of deterministic jitter (DJ), random jitter (RJ), sinusoidal/periodic jitter (PJ) and total jitter (TJ) - as separate specs. To properly test backplane transceivers to these industrial standards, we need to decompose different kinds of jitter in a jitter measurement, and also generate a signal composed of different kinds of jitter for jitter-tolerance testing. Despite its importance, jitter test equipment suited for backplane SerDes is in its infancy. In this article, we describe, compare, and correlate some existing techniques. The backplane jitter test requirements for the test and measurement industry are defined from an IC test engineering perspective.
Keywords
data communication; digital communication; error statistics; integrated circuit testing; jitter; logic testing; measurement standards; system buses; transceivers; BER; DJ; Fiber Channel; Gigabit Ethernet; IC test; Infiniband; PJ; RJ; TJ; backplane SerDes; bit error ratio; broadband backplanes; bus loading effects; bus-based architectures; communication standards; deterministic jitter; fabric/mesh-based high-speed architectures; gigabit serial communication transceivers; industrial standards; integration density/data rate increase; jitter decomposition/combination; jitter measurement; jitter signal generation; jitter test equipment; jitter-tolerance testing; long haul transceivers; multi-Gbit backplane serializer/deserializer jitter testing; random jitter; sinusoidal/periodic jitter; total jitter; Backplanes; Communication standards; Ethernet networks; Fabrics; Integrated circuit testing; Jitter; Optical fiber communication; Optical fiber devices; Optical fiber testing; Transceivers;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041822
Filename
1041822
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