• DocumentCode
    2378078
  • Title

    Exceptional performance from the development, qualification and implementation of a silicone adhesive for bonding heatsinks to semiconductor packages

  • Author

    Bosworth, Stephen ; Hsu, Shih C. ; Polcari, Joseph

  • Author_Institution
    Digital Equipment Corp., Hudson, MA, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    260
  • Lastpage
    269
  • Abstract
    The stress induced by the Coefficient of Thermal Expansion (CTE) mismatch of ceramic semiconductor packages bonded to aluminum heatsinks created a high risk of cracking. As packages increase in size and power, the need for an advanced adhesive with compliant properties, reliable bond strengths and high thermal performance is required. As a result of the work reported here, heatsink attach capabilities have been enhanced significantly with attractive cost benefits. Epoxy, silicone and polyimidesilaxoane adhesives were investigated for their process, material, reliability, and thermal performance. The project was divided into three phases: process development, qualification, and implementation. Concurrent engineering was emphasized to deliver a high-quality and low-cost process to production in a timely manner. In the initial development phase, over forty commercial and proprietary adhesives were evaluated based on the CTE, modulus and bond strength subjected to thermal cycling and moisture tests. A predictive thermo-mechanical and mechanical model was developed to define the required adhesive properties as a function of heatsinks weight and geometries. The wafer bow technique was used to estimate the induced stress from adhesive attach
  • Keywords
    adhesion; concurrent engineering; cracks; heat sinks; life testing; semiconductor device packaging; semiconductor device reliability; silicones; thermal expansion; bond strengths; ceramic semiconductor packages; coefficient of thermal expansion mismatch; compliant properties; concurrent engineering; cracking; epoxy adhesives; heatsink bonding; mechanical model; moisture tests; polyimidesilaxoane adhesives; reliability; semiconductor packages; silicone adhesive; silicone adhesives; thermal cycling; thermal performance; thermomechanical model; wafer bow technique; Aluminum; Bonding; Ceramics; Concurrent engineering; Heat sinks; Materials reliability; Qualifications; Semiconductor device packaging; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1994. Proceedings., 44th
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0914-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1994.367622
  • Filename
    367622