DocumentCode :
2378078
Title :
Exceptional performance from the development, qualification and implementation of a silicone adhesive for bonding heatsinks to semiconductor packages
Author :
Bosworth, Stephen ; Hsu, Shih C. ; Polcari, Joseph
Author_Institution :
Digital Equipment Corp., Hudson, MA, USA
fYear :
1994
fDate :
1-4 May 1994
Firstpage :
260
Lastpage :
269
Abstract :
The stress induced by the Coefficient of Thermal Expansion (CTE) mismatch of ceramic semiconductor packages bonded to aluminum heatsinks created a high risk of cracking. As packages increase in size and power, the need for an advanced adhesive with compliant properties, reliable bond strengths and high thermal performance is required. As a result of the work reported here, heatsink attach capabilities have been enhanced significantly with attractive cost benefits. Epoxy, silicone and polyimidesilaxoane adhesives were investigated for their process, material, reliability, and thermal performance. The project was divided into three phases: process development, qualification, and implementation. Concurrent engineering was emphasized to deliver a high-quality and low-cost process to production in a timely manner. In the initial development phase, over forty commercial and proprietary adhesives were evaluated based on the CTE, modulus and bond strength subjected to thermal cycling and moisture tests. A predictive thermo-mechanical and mechanical model was developed to define the required adhesive properties as a function of heatsinks weight and geometries. The wafer bow technique was used to estimate the induced stress from adhesive attach
Keywords :
adhesion; concurrent engineering; cracks; heat sinks; life testing; semiconductor device packaging; semiconductor device reliability; silicones; thermal expansion; bond strengths; ceramic semiconductor packages; coefficient of thermal expansion mismatch; compliant properties; concurrent engineering; cracking; epoxy adhesives; heatsink bonding; mechanical model; moisture tests; polyimidesilaxoane adhesives; reliability; semiconductor packages; silicone adhesive; silicone adhesives; thermal cycling; thermal performance; thermomechanical model; wafer bow technique; Aluminum; Bonding; Ceramics; Concurrent engineering; Heat sinks; Materials reliability; Qualifications; Semiconductor device packaging; Thermal expansion; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1994. Proceedings., 44th
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0914-6
Type :
conf
DOI :
10.1109/ECTC.1994.367622
Filename :
367622
Link To Document :
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