DocumentCode :
2378095
Title :
Analysis of switched reluctance motor drive under fault conditions
Author :
Sharma, Virendra Kumar ; Murthy, S.S. ; Singh, Bhim
Author_Institution :
Dept. of Electr. Eng., Indian Inst. of Technol., New Delhi, India
Volume :
1
fYear :
1998
fDate :
12-15 Oct. 1998
Firstpage :
553
Abstract :
The paper presents a comprehensive analysis of a switched reluctance motor (SRM) drive system under different realistic fault conditions. A simple modeling and simulation technique is used to investigate the fault tolerant behavior of SRMs, based on current and position dependent nonlinear flux linkage, which is found to be more appropriate compared to other methods reported in literature. Typical cases considered are: open circuit faults on windings, converter device short or open circuit, and reduced DC link voltage caused by rectifier faults and single phasing of input supply. Pre-fault condition is taken to be the steady state operation under no load or full load torque at rated speed. The performance indices under fault conditions are speed ripple, torque ripple, steady state error in speed, starting and reversal time. The response of speed, current and torque under pre-fault and pod-fault conditions are compared to illustrate the fault tolerant capabilities of the SRM drive under dynamic operating conditions.
Keywords :
electrical faults; fault tolerance; machine theory; machine windings; power convertors; reluctance motor drives; DC link voltage reduction; SRM; dynamic operating conditions; fault conditions; fault tolerant behavior; fault tolerant capabilities; modeling technique; nonlinear flux linkage; open circuit winding faults; performance indices; power converter faults; simulation technique; speed ripple; steady state error; steady state operation; switched reluctance motor drive; torque ripple; Circuit faults; Circuit simulation; Couplings; Fault tolerance; Rectifiers; Reluctance machines; Reluctance motors; Steady-state; Torque; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE
Conference_Location :
St. Louis, MO, USA
ISSN :
0197-2618
Print_ISBN :
0-7803-4943-1
Type :
conf
DOI :
10.1109/IAS.1998.732372
Filename :
732372
Link To Document :
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