Characterizing a noninsertable directional device using the NIST uncertainty framework

Author

Jargon, Jeffrey A. ; Williams, Dylan F. ; Hale, Paul D. ; Janezic, Michael D.

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO, USA

fYear

2014

fDate

6-6 June 2014

Firstpage

1

Lastpage

3

Abstract

We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of a chain of components, including a coaxial-to-waveguide adapter, a waveguide band-pass filter, a waveguide low-noise amplifier, a waveguide isolator, and a waveguide taper. With the aforementioned directional components, the well-known adapter removal technique is not adequate on its own for characterizing our device. In this paper, we describe and implement our method, and propagate the uncertainties from the two required calibrations to the characterized device.

Keywords

band-pass filters; low noise amplifiers; measurement uncertainty; microwave isolators; millimetre wave measurement; waveguide filters; NIST uncertainty framework; calibrations; coaxial-to-waveguide adapter; frequency 90 GHz to 100 GHz; noninsertable directional device; vector network analyzer; waveguide band-pass filter; waveguide isolator; waveguide low-noise amplifier; waveguide taper; Calibration; Microwave measurement; Microwave theory and techniques; NIST; Scattering parameters; Uncertainty; Waveguide components; Characterize; coaxial; directional; noninsertable; rectangular waveguide; uncertainty; vector network analyzer;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Measurement Conference (ARFTG), 2014 83rd ARFTG

Conference_Location

Tampa, FL

Type

conf

DOI

10.1109/ARFTG.2014.6899513

Filename

6899513