DocumentCode :
237848
Title :
Active harmonic source-/load-pull measurements of AlGaN/GaN HEMTs at X-band frequencies
Author :
Maier, Thomas ; Carrubba, V. ; Quay, Ruediger ; van Raay, Friedbert ; Ambacher, Oliver
Author_Institution :
Fraunhofer Inst. for Appl. Solid State Phys. (IAF), Freiburg, Germany
fYear :
2014
fDate :
6-6 June 2014
Firstpage :
1
Lastpage :
4
Abstract :
Active harmonic loadpull measurements investigation for a 1-mm AlGaN/GaN HEMT power transistor at X-Band frequencies are in this paper reported. The paper highlights the transistor performances in terms of maximum PAE, POUT and Gain achieved at 8.7 GHz together with the application of a systematic source-/load-pull measurement procedure including wafer-mapping capability. The measurements were carried out using an active harmonic loadpull test system with four control loops. In particular, fundamental and second harmonic “loads” as well as second harmonic “source” terminations have been properly varied and optimized. The 1-mm GaN power device delivered very high efficiency of DE=71.2% and PAE=66.1%, together with high POUT and power gain of 35 dBm (3.2 W) and 11.5 dB, respectively.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; microwave power transistors; power HEMT; wide band gap semiconductors; HEMT power transistor; PAE; POUT; X-band; active harmonic load-pull measurement; active harmonic loadpull test system; active harmonic source-measurement; frequency 8.7 GHz; power 3.2 W; wafer-mapping; Atmospheric measurements; Gallium nitride; HEMTs; Particle measurements; Radio frequency; Tuners; Wireless communication; Active; efficiency; harmonic; loadpull; tuning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Measurement Conference (ARFTG), 2014 83rd ARFTG
Conference_Location :
Tampa, FL
Type :
conf
DOI :
10.1109/ARFTG.2014.6899516
Filename :
6899516
Link To Document :
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