DocumentCode :
2378536
Title :
Pseudo random patterns using Markov sources for scan BIST
Author :
Basturkmen, Nadir Z. ; Reddy, Sudhakar M. ; Pomeranz, Irith
Author_Institution :
Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA
fYear :
2002
fDate :
2002
Firstpage :
1013
Lastpage :
1021
Abstract :
Proposes a new pseudo-random pattern generator for scan circuits. The proposed generator uses Markov sources to capture spatial correlations between consecutive bits inside a scan chain as defined by weight sets generated using a weighted random pattern testing method. The weight set generation is based on the analysis of deterministic test sets. The BIST scheme that uses the proposed pattern generator iteratively modifies the generator behavior to obtain a full fault coverage. Experiments conducted on large benchmark circuits demonstrate that the proposed BIST methodology can achieve full fault coverage with a small number of tests and a small hardware overhead.
Keywords :
Markov processes; VLSI; automatic test pattern generation; boundary scan testing; built-in self test; fault simulation; finite state machines; integrated circuit testing; sequential circuits; Markov sources; benchmark circuits; consecutive bits; deterministic test sets; fault simulation; full fault coverage; hardware overhead; pseudo random patterns; scan BIST; scan chain; sequential BIST; spatial correlations; weight sets; weighted random pattern testing method; Built-in self-test; Circuit faults; Circuit testing; Cities and towns; Costs; Fault detection; Hardware; Integrated circuit testing; Sun; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2002. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-7542-4
Type :
conf
DOI :
10.1109/TEST.2002.1041857
Filename :
1041857
Link To Document :
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