DocumentCode :
2378624
Title :
Test coverage: what does it mean when a board test passes?
Author :
Hird, Kathy ; Parker, Kenneth P. ; Follis, Bill
Author_Institution :
Agilent Technol., Loveland, CO, USA
fYear :
2002
fDate :
2002
Firstpage :
1066
Lastpage :
1074
Abstract :
Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment that today includes a variety of diverse testing approaches from visual and penetrative inspection to classical in-circuit test. A better depiction of test coverage is achieved by developing a list of potential defects referred to as the defect universe, where the capabilities of the chosen test strategy are not considered in development of this defect list. Coverage is measured by grading the capabilities of each test process against the defect universe. The defect universe is defined to be meaningful to the bulk of the electronics industry and to provide a consistent framework for coverage metrics and comparisons.
Keywords :
automatic testing; inspection; printed circuit testing; production testing; board test; coverage metrics; electronics industry; inspection; limited access testing environment; test coverage; test process; test strategy; Capacitors; Electronic equipment testing; Hardware; Inspection; Pins; Polarization; Resistors; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 2002. Proceedings. International
ISSN :
1089-3539
Print_ISBN :
0-7803-7542-4
Type :
conf
DOI :
10.1109/TEST.2002.1041863
Filename :
1041863
Link To Document :
بازگشت