DocumentCode
2378624
Title
Test coverage: what does it mean when a board test passes?
Author
Hird, Kathy ; Parker, Kenneth P. ; Follis, Bill
Author_Institution
Agilent Technol., Loveland, CO, USA
fYear
2002
fDate
2002
Firstpage
1066
Lastpage
1074
Abstract
Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment that today includes a variety of diverse testing approaches from visual and penetrative inspection to classical in-circuit test. A better depiction of test coverage is achieved by developing a list of potential defects referred to as the defect universe, where the capabilities of the chosen test strategy are not considered in development of this defect list. Coverage is measured by grading the capabilities of each test process against the defect universe. The defect universe is defined to be meaningful to the bulk of the electronics industry and to provide a consistent framework for coverage metrics and comparisons.
Keywords
automatic testing; inspection; printed circuit testing; production testing; board test; coverage metrics; electronics industry; inspection; limited access testing environment; test coverage; test process; test strategy; Capacitors; Electronic equipment testing; Hardware; Inspection; Pins; Polarization; Resistors; Soldering;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041863
Filename
1041863
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