• DocumentCode
    2378624
  • Title

    Test coverage: what does it mean when a board test passes?

  • Author

    Hird, Kathy ; Parker, Kenneth P. ; Follis, Bill

  • Author_Institution
    Agilent Technol., Loveland, CO, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1066
  • Lastpage
    1074
  • Abstract
    Characterizing board test coverage as a percentage of devices or nodes having tests does not accurately portray coverage, especially in a limited access testing environment that today includes a variety of diverse testing approaches from visual and penetrative inspection to classical in-circuit test. A better depiction of test coverage is achieved by developing a list of potential defects referred to as the defect universe, where the capabilities of the chosen test strategy are not considered in development of this defect list. Coverage is measured by grading the capabilities of each test process against the defect universe. The defect universe is defined to be meaningful to the bulk of the electronics industry and to provide a consistent framework for coverage metrics and comparisons.
  • Keywords
    automatic testing; inspection; printed circuit testing; production testing; board test; coverage metrics; electronics industry; inspection; limited access testing environment; test coverage; test process; test strategy; Capacitors; Electronic equipment testing; Hardware; Inspection; Pins; Polarization; Resistors; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2002. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7542-4
  • Type

    conf

  • DOI
    10.1109/TEST.2002.1041863
  • Filename
    1041863