Title :
296 lead fine pitch (0.4 mm) thin plastic QFP package with TAB interconnect
Author_Institution :
Intel Corp., Chandler, AZ, USA
Abstract :
The Quad Flat Pack (QFP) package has become the Surface Mount Technology (SMT) package of choice for microprocessors and peripheral devices and is well suited for hand held computer application. To address this market segment Intel has developed a new package with thin (2.0 mm) body for light weight; low standoff (0.25 mm maximum) for overall lower profile; in a 32 mm×32 mm body format. Tape automated bonding (TAB) interconnect from die to the leadframe is used to overcome wirebond interconnect limitations. This package provides a more manufacturable package system by using flat handling during test operation. The package is trimmed and formed subsequent to test operation and shipped in standard JEDEC thin matrix plastic trays, ready to use for SMT operation with good lead coplanarity. Package reliability is equivalent to other plastic packages. Sample packages were supplied to selected customers to help develop the 0.4 mm pin pitch SMT process, equipment and materials. The feedback/results indicate that the current base of installed SMT equipment is capable of assembling such 0.4 mm pitch packages with very little or no modification and at acceptable quality levels
Keywords :
fine-pitch technology; integrated circuit interconnections; integrated circuit packaging; integrated circuit reliability; plastic packaging; quality control; surface mount technology; tape automated bonding; 0.4 mm; 32 mm; JEDEC thin matrix plastic trays; TAB interconnect; assembling; fine pitch; flat handling; lead coplanarity; leadframe; manufacturable package system; plastic packages; quality levels; standoff; surface mount technology; test operation; thin plastic QFP package; Bonding; Computer applications; Electronics packaging; Feedback; Manufacturing; Microprocessors; Packaging machines; Plastic packaging; Surface-mount technology; System testing;
Conference_Titel :
Electronic Components and Technology Conference, 1994. Proceedings., 44th
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-0914-6
DOI :
10.1109/ECTC.1994.367652