• DocumentCode
    2378731
  • Title

    Models and techniques for the reliability analysis of the smart grid

  • Author

    Bose, Anjan

  • Author_Institution
    Sch. of EECS, Washington State Univ., Pullman, WA, USA
  • fYear
    2010
  • fDate
    25-29 July 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Calculating the reliability of the power grid is difficult because it is made up of thousands of components and even though the failure mode of each component may be known, they are not independent of each other. Thus the models required to conduct reliability analysis are difficult to develop and are often complex enough to make the techniques for analysis very cumbersome. Usually controllers like protection relays have been considered more such components and their failures taken into account. However, these independent relays and other controllers are morphing into more complex control systems that can be considered a layer of cyber system that overlays the power grid. This means that the failure modes of these relays and controls are no longer independent but are causally connected to each other through software and communications. In this presentation, we will discuss the models and methods of reliability analysis that are used today, how these models and analysis are being complicated by the growing cyber layer as a result of the move towards a smart grid, and what some of the directions of research may be to surmount the difficulties of analyzing this cyber-physical system.
  • Keywords
    large-scale systems; power system control; power system relaying; power system reliability; smart power grids; complex control system; cyber system layer; cyber-physical system; independent relays; reliability analysis; reliability analysis techniques; smart power grid; Cyber-Physical System; Information Infrastructure; Power Grid Communications; Real Time Distributed Database; Smart Grid Applications;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Society General Meeting, 2010 IEEE
  • Conference_Location
    Minneapolis, MN
  • ISSN
    1944-9925
  • Print_ISBN
    978-1-4244-6549-1
  • Electronic_ISBN
    1944-9925
  • Type

    conf

  • DOI
    10.1109/PES.2010.5589527
  • Filename
    5589527