Title :
Can IC test learn from how a tester is tested
Author :
Rajsuman, Rochit
Author_Institution :
Advantest America R & D Center Inc., Santa Clara, CA, USA
Abstract :
Summary form only given. A tester as well as an IC is a system at different abstraction levels. The testing of each of these systems should contain individual component testing as well as a full system level functional test to ensure its functional correctness. A full functional test of IC should be done regardless of the fault coverage of individual blocks and test methodology including DFT, structural test, Iddq etc. The interfaces and synergy in the operation of blocks can only be determined by functional test.
Keywords :
automatic testing; integrated circuit testing; IC test; component testing; functional test; Application specific integrated circuits; Assembly; Computational modeling; Electronic equipment testing; Hardware; Integrated circuit modeling; Integrated circuit testing; Software design; Software testing; System testing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041894
