Title :
What can IC test teach system test?
Author_Institution :
Sun Microsystems Inc., Palo Alto, CA, USA
Abstract :
This article first of all discusses IC test technology and advocates that similar methodologies could be applied to the area of system test. Topics discussed include: product complexity; fault coverage measurement; fault simulation; fault insertion; stuck-at faults; built-in test; DFT; and system diagnostics.
Keywords :
built-in self test; design for testability; electronic equipment testing; fault location; fault simulation; production testing; program diagnostics; DFT; IC test methodologies; IC test technology; built-in test; electronic equipment testing; fault coverage measurement; fault insertion; fault simulation; product/system complexity; stuck-at faults; system diagnostics; system test; Application specific integrated circuits; Fault detection; Integrated circuit modeling; Integrated circuit testing; Silicon; Sun; System testing; Telephony; Time to market; Writing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041895
