DocumentCode
2378912
Title
What can IC test teach system test?
Author
Davidson, Scott
Author_Institution
Sun Microsystems Inc., Palo Alto, CA, USA
fYear
2002
fDate
2002
Firstpage
1187
Abstract
This article first of all discusses IC test technology and advocates that similar methodologies could be applied to the area of system test. Topics discussed include: product complexity; fault coverage measurement; fault simulation; fault insertion; stuck-at faults; built-in test; DFT; and system diagnostics.
Keywords
built-in self test; design for testability; electronic equipment testing; fault location; fault simulation; production testing; program diagnostics; DFT; IC test methodologies; IC test technology; built-in test; electronic equipment testing; fault coverage measurement; fault insertion; fault simulation; product/system complexity; stuck-at faults; system diagnostics; system test; Application specific integrated circuits; Fault detection; Integrated circuit modeling; Integrated circuit testing; Silicon; Sun; System testing; Telephony; Time to market; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041895
Filename
1041895
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