DocumentCode
2379023
Title
TAPs all over my chips
Author
Lousberg, M.
Author_Institution
Philips Res., Eindhoven, Netherlands
fYear
2002
fDate
2002
Firstpage
1189
Abstract
Summary form only given. This article discusses chip test access ports (TAPs). Topics covered include: embedded core testing; chip TAP number; IEEE1149.1 standard; debug and diagnostics; internal TAP controllers; and compliance standards.
Keywords
IEEE standards; computer interfaces; digital integrated circuits; embedded systems; integrated circuit testing; logic testing; IC test; IC test access ports; IEEE 1149.1 standard; chip TAP number; compliance standards; debug; diagnostics; embedded core testing; internal TAP controllers; Automatic test pattern generation; Best practices; Built-in self-test; Logic testing; Pins; Production; Semiconductor device testing; System testing; System-on-a-chip;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041900
Filename
1041900
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