Mixed-signal BIST: fact or fiction

Author

Arabi, Karim

fYear

2002

fDate

2002

Firstpage

1200

Abstract

Summary form only given. Most of today´s SoCs embed complex analog and mixed-signal cores. BIST has been seen as one of the most promising potential solutions for embedded mixed-signal cores. But, the viability of mixed-signal BIST as a credible and general-purpose test solution has always been questioned for the past decade. It has been subject to many success stories and several failures and disappointments, but a standard solution has not emerged yet. This panel aims at highlighting challenges of designing a practical mixed-signal BIST solution and tackles its viability as a general-purpose solution for embedded mixed-signal cores. The panel aims at discussion of issues related to mixed-signal BIST. This panel will help the industry focusing on the most promising mixed-signal BIST solutions.

Keywords

automatic testing; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; BIST; SoCs; complex mixed-signal cores; embedded mixed-signal cores; general-purpose test solution; viability; Built-in self-test; Calibration; Circuit optimization; Circuit testing; Costs; Degradation; Design engineering; Feedback loop; Process design; Semiconductor device measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2002. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-7542-4

Type

conf

DOI

10.1109/TEST.2002.1041908

Filename

1041908