• DocumentCode
    2379140
  • Title

    Mixed signal BIST: fact or fiction

  • Author

    Song, Lee Y.

  • Author_Institution
    Teradyne Inc., Agoura Hills, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1203
  • Abstract
    Is mixed-signal BIST a viable, general-purpose test solution? Many of today´s SoC devices embed complex analog and mixed-signal cores, and some in the industry have seen mixed-signal BIST as one of the most promising potential solutions. Nonetheless, mixed-signal BIST is far from a general-purpose solution and will remain an ad-hoc solution in the foreseeable future. But because of increasing demands on mixed-signal core testing and the drive to lower the cost of test, the use of mixed-signal BIST will grow, both as an alternative and supplement to traditional mixed signal test methods.
  • Keywords
    automatic test equipment; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; SoC devices; ad-hoc solution; complex analog cores; complex mixed-signal cores; core testing; general-purpose test solution; mixed signal BIST; Analog circuits; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Equations; Throughput;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2002. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7542-4
  • Type

    conf

  • DOI
    10.1109/TEST.2002.1041909
  • Filename
    1041909