DocumentCode
2379140
Title
Mixed signal BIST: fact or fiction
Author
Song, Lee Y.
Author_Institution
Teradyne Inc., Agoura Hills, CA, USA
fYear
2002
fDate
2002
Firstpage
1203
Abstract
Is mixed-signal BIST a viable, general-purpose test solution? Many of today´s SoC devices embed complex analog and mixed-signal cores, and some in the industry have seen mixed-signal BIST as one of the most promising potential solutions. Nonetheless, mixed-signal BIST is far from a general-purpose solution and will remain an ad-hoc solution in the foreseeable future. But because of increasing demands on mixed-signal core testing and the drive to lower the cost of test, the use of mixed-signal BIST will grow, both as an alternative and supplement to traditional mixed signal test methods.
Keywords
automatic test equipment; built-in self test; integrated circuit testing; mixed analogue-digital integrated circuits; system-on-chip; SoC devices; ad-hoc solution; complex analog cores; complex mixed-signal cores; core testing; general-purpose test solution; mixed signal BIST; Analog circuits; Automatic test pattern generation; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Equations; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041909
Filename
1041909
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