• DocumentCode
    2379195
  • Title

    Mission impossible? Open architecture ATE

  • Author

    Conti, Dennis R.

  • Author_Institution
    IBM Microelectron. Div., Essex Junction, VT, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1207
  • Abstract
    Summary form only given. A premise behind the open architecture system is to have a single set of hardware and software standards across the test industry, allowing instrumentation to be exchanged between ATE supplier boundaries. This paper asks whether the ATE suppliers will cooperate to set and maintain these standards while maintaining competition, and if not, looks at whether there is a sufficient number of third party suppliers to support multiple open architectures.
  • Keywords
    automatic test equipment; electronic equipment manufacture; open systems; standards; ATE standards; ATE supplier boundaries; ATE supplier competition; ATE supplier cooperation; hardware standards; instrumentation exchange; multiple open architectures; open architecture ATE; software standards; test industry; third party suppliers; Computer architecture; Computer industry; Costs; Hardware; Instruments; Microelectronics; Rivers; Software standards; Software testing; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2002. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7542-4
  • Type

    conf

  • DOI
    10.1109/TEST.2002.1041912
  • Filename
    1041912