DocumentCode
2379213
Title
Mission possible? Open architecture ATE
Author
Shahriari, Navid
Author_Institution
Third Millennium Test Solutions
fYear
2002
fDate
2002
Firstpage
1206
Abstract
Summary form only given. The current ATE business model is on a path to making test unaffordable. There are several competing technologies, and no synergy between platforms. Adopting an open standard similar to the PC business model could offer significant advantage to both test equipment suppliers and users. ATE instrument solutions implemented in the VXI (VME extensions for instrumentation) and PXI (PCI extensions for instrumentation) are good examples of standards that support modularity and long-term capability scaling. This article discusses the technical feasibility and potential benefits of such an architecture.
Keywords
automatic test equipment; open systems; peripheral interfaces; standards; ATE business model; ATE industry; PC business model; PCI extensions for instrumentation; PXI; VME extensions for instrumentation; VXI; competing test technologies; long-term capability scaling; modularity; open architecture ATE; open standard; technical feasibility; test costs; test equipment suppliers; test equipment users;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041913
Filename
1041913
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