Title :
Quality measurement for transmitted audio data using distribution of sub-band signals
Author :
Nguyen, D.C. ; Cho, J.W. ; Park, J.H. ; Jung, H.Y. ; Chung, H.Y.
Author_Institution :
Dept. of Info.& Comm. Eng., Yeungnam Univ., Gyeongsan
Abstract :
Recently, the remarkable progress of network technology has increased the requirement for transmission of high quality multimedia data. By the trend, it has been issued to investigate an efficient methodology for quality measurement of transmitted multimedia data. In this paper, we propose a new audio quality measurement technique to substitute for a typical quality measurement tool, RMSE (root mean squared error). The proposed method modifies the variance of sub-band signals to perform the estimation of audio quality at the transmitter, the receiver is able to estimate the quality distortion of transmitted audio data by calculating the distance between the variance and the reference value representing the characteristics of sub-band signals, so called eve (estimated variance error). The proposed is as no reference technique, it does not require the original data to measure the audio quality. On the Gaussian noise channel with several standard deviations, we prove that the proposed scheme has good performance, and it is a novel alternative to RMSE.
Keywords :
Gaussian channels; Gaussian noise; audio signal processing; mean square error methods; multimedia communication; Gaussian noise channel; audio data transmittion; audio quality measurement technique; estimated variance error; high quality multimedia data transmission; root mean squared error; subband signals estimation variance; transmitter; Costs; Discrete wavelet transforms; Distortion measurement; Gaussian noise; Measurement techniques; Multimedia systems; Quality of service; Transform coding; Transmitters; Watermarking;
Conference_Titel :
Research, Innovation and Vision for the Future, 2008. RIVF 2008. IEEE International Conference on
Conference_Location :
Ho Chi Minh City
Print_ISBN :
978-1-4244-2379-8
Electronic_ISBN :
978-1-4244-2380-4
DOI :
10.1109/RIVF.2008.4586350