• DocumentCode
    237927
  • Title

    Critical aspects adversely affecting accuracy of radiation pattern and polarization measurements with three spherical scanners at high microwave frequencies

  • Author

    Byndas, Arkadiusz ; Kabacik, Pawel

  • Author_Institution
    Fac. of Electron., Wroclaw Univ. of Technol., Wroclaw, Poland
  • fYear
    2014
  • fDate
    16-18 June 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Ability to perform spherical measurements of small to medium size antennas at high microwave frequencies is presented in this paper. The focus is on three scanning system developed in-house by the authors. A key to accuracy of measurements is a careful approach to antenna positioner design and to maintaining geometrical accuracies during probe scanning. The following approaches have been presented: two dual-wheel systems made with different materials and a probe circling setup with the semi-arm. It is shown, how a set of acquired electric field samples on the sphere, can be used for direct determination of antenna radiation efficiency.
  • Keywords
    antenna radiation patterns; antenna testing; electromagnetic wave polarisation; microwave antennas; antenna positioner design; antenna radiation efficiency; antenna radiation pattern accuracy; dual-wheel systems; electric field samples; geometrical accuracies; high microwave frequencies; polarization measurements; spherical scanners; Antenna measurements; Antennas; Frequency measurement; Phantoms; Probes; antenna efficiency measurements; antenna measurements in the spherical format; near-field antenna measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwaves, Radar, and Wireless Communication (MIKON), 2014 20th International Conference on
  • Conference_Location
    Gdansk
  • Print_ISBN
    978-617-607-553-0
  • Type

    conf

  • DOI
    10.1109/MIKON.2014.6899829
  • Filename
    6899829