DocumentCode :
237927
Title :
Critical aspects adversely affecting accuracy of radiation pattern and polarization measurements with three spherical scanners at high microwave frequencies
Author :
Byndas, Arkadiusz ; Kabacik, Pawel
Author_Institution :
Fac. of Electron., Wroclaw Univ. of Technol., Wroclaw, Poland
fYear :
2014
fDate :
16-18 June 2014
Firstpage :
1
Lastpage :
4
Abstract :
Ability to perform spherical measurements of small to medium size antennas at high microwave frequencies is presented in this paper. The focus is on three scanning system developed in-house by the authors. A key to accuracy of measurements is a careful approach to antenna positioner design and to maintaining geometrical accuracies during probe scanning. The following approaches have been presented: two dual-wheel systems made with different materials and a probe circling setup with the semi-arm. It is shown, how a set of acquired electric field samples on the sphere, can be used for direct determination of antenna radiation efficiency.
Keywords :
antenna radiation patterns; antenna testing; electromagnetic wave polarisation; microwave antennas; antenna positioner design; antenna radiation efficiency; antenna radiation pattern accuracy; dual-wheel systems; electric field samples; geometrical accuracies; high microwave frequencies; polarization measurements; spherical scanners; Antenna measurements; Antennas; Frequency measurement; Phantoms; Probes; antenna efficiency measurements; antenna measurements in the spherical format; near-field antenna measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwaves, Radar, and Wireless Communication (MIKON), 2014 20th International Conference on
Conference_Location :
Gdansk
Print_ISBN :
978-617-607-553-0
Type :
conf
DOI :
10.1109/MIKON.2014.6899829
Filename :
6899829
Link To Document :
بازگشت