• DocumentCode
    2379287
  • Title

    Open ATE architecture: key challenges

  • Author

    West, Burnell G.

  • Author_Institution
    NPTest, San Jose, CA, USA
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1212
  • Abstract
    The drive to reduce overall cost of test has a long history. However, the possibility to reduce this overall cost of test by developing an open ATE architecture has only recently begun to be explored in much detail. It seems clear that opening up ATE system architecture to participation by a collection of suppliers is now feasible. Open architecture standards for test systems must embody several key features, the most challenging of these being fixturing, synchronization, software, data volume, power delivery, and system integration and verification.
  • Keywords
    automatic test equipment; automatic test software; formal verification; integrated circuit testing; open systems; synchronisation; IC test; automatic test equipment; fixturing; open ATE architecture key challenges; power delivery; synchronization; system integration/verification; test cost reduction; test data volume; test system software; Certification; Computer architecture; Cooling; Costs; Fixtures; Instruments; Packaging; Software packages; Software tools; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 2002. Proceedings. International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-7542-4
  • Type

    conf

  • DOI
    10.1109/TEST.2002.1041917
  • Filename
    1041917