DocumentCode
2379287
Title
Open ATE architecture: key challenges
Author
West, Burnell G.
Author_Institution
NPTest, San Jose, CA, USA
fYear
2002
fDate
2002
Firstpage
1212
Abstract
The drive to reduce overall cost of test has a long history. However, the possibility to reduce this overall cost of test by developing an open ATE architecture has only recently begun to be explored in much detail. It seems clear that opening up ATE system architecture to participation by a collection of suppliers is now feasible. Open architecture standards for test systems must embody several key features, the most challenging of these being fixturing, synchronization, software, data volume, power delivery, and system integration and verification.
Keywords
automatic test equipment; automatic test software; formal verification; integrated circuit testing; open systems; synchronisation; IC test; automatic test equipment; fixturing; open ATE architecture key challenges; power delivery; synchronization; system integration/verification; test cost reduction; test data volume; test system software; Certification; Computer architecture; Cooling; Costs; Fixtures; Instruments; Packaging; Software packages; Software tools; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041917
Filename
1041917
Link To Document