Dynamic test scheduling for analog circuits for improved test quality

In this paper, we present an innovative test scheduling method to improve test quality and/or reduce test time for analog circuits. Our dynamic test scheduling approach predicts the fail probability of unmeasured specifications with the aim of passing statistically well-behaved chips early on so as to devote more resources to marginal devices. Results show that for a gain controlled LNA circuit, with 48 specification parameters, it is possible to achieve 67% improvement in test quality for the same test time or 19.2% test time reduction with the same test quality compared to the widely used set cover method.