DocumentCode
2379393
Title
Test and repair of non-volatile commodity and embedded memories (NAND flash memory)
Author
Shirota, Riichiro
Author_Institution
Semicond. Co., Toshiba Corp., Yokohama, Japan
fYear
2002
fDate
2002
Firstpage
1221
Abstract
Summary form only given. The test time of the memory chip is a very important issue. It mainly depends on the program and erase time. NAND flash memories perform high speed programming and erasing. This high speed reprogramming scheme reduces the test cost. The program/erase endurance reliability is another important test issue. In order to perform at high reliability, NAND flash memories use ECC technology. Using ECC technology, multi-level as well as single-level NAND flash memories perform with high endurance reliabilities.
Keywords
NAND circuits; flash memories; integrated circuit reliability; integrated circuit testing; integrated memory circuits; logic testing; ECC technology; NAND flash memories; high reliability memories; high speed erasing; high speed programming; memory chip testing; nonvolatile commodity memories; nonvolatile embedded memories; program/erase endurance reliability; test cost reduction; test time; Electrons; Error correction codes; Nonvolatile memory; Semiconductor device testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041924
Filename
1041924
Link To Document