Title :
A quality-threshold data summarization algorithm
Author :
Ha-Thuc, Viet ; Nguyen, Duc-Cuong ; Srinivasan, Padmini
Author_Institution :
Comput. Sci. Dept., Univ. of Iowa, Iowa City, IA
Abstract :
As database sizes increase, semantic data summarization techniques have been developed, so that data mining algorithms can be run on the summarized set for the sake of efficiency. Clustering algorithms such as K-Means have popularly been used as semantic summarization methods where cluster centers become the summarized set. The goal of semantic summarization is to provide a summarized view of the original dataset such that the summarization ratio is maximized while the error (i.e., information loss) is minimized. This paper presents a new clustering-based data summarization algorithm, in which the quality of the summarized set can be controlled. The algorithm partitions a dataset into a number of clusters until the distortion of each cluster is less than a given threshold, thus guaranteeing the summarized set has less than a fixed amount of information loss. Based on the threshold, the number of clusters is automatically determined. The proposed algorithm, unlike traditional K-Means, adjusts initial centers based on the information about the data space discovered so far, thus significantly alleviating the local optimum effect. Our experiments show that our algorithm generates higher quality clusters than K-Means does and it also guarantees an error bound, an essential criterion for data summarization.
Keywords :
data handling; data mining; pattern clustering; K-means algorithm; clustering-based data summarization algorithm; data mining algorithm; quality-threshold data summarization; semantic data summarization technique; Automatic control; Cities and towns; Clustering algorithms; Computer science; Data engineering; Data mining; Databases; Information science; Libraries; Partitioning algorithms; Data Summarization (or Compression); K-Means Clustering;
Conference_Titel :
Research, Innovation and Vision for the Future, 2008. RIVF 2008. IEEE International Conference on
Conference_Location :
Ho Chi Minh City
Print_ISBN :
978-1-4244-2379-8
Electronic_ISBN :
978-1-4244-2380-4
DOI :
10.1109/RIVF.2008.4586362