Abstract :
Summary form only given. Semiconductor memory market has been driven by DRAM. However non-volatile memory market, flash memory as a representative, is growing remarkably because of its versatile application market such as cellular phone, PC memory card, silicon audio, digital still camera storage, automobile application with MCU and so forth. In terms of testing, it is quite different from DRAM. The author describes the differences, requirements and solutions for flash memory repair and testing from the viewpoint of ATE.
Keywords :
automatic testing; flash memories; integrated circuit testing; integrated memory circuits; logic testing; ATE; NAND/AND device; embedded flash memory; flash memory repair; flash memory testing; nonvolatile memory; semiconductor memory; Cellular phones; Cost function; Flash memory; Logic devices; Logic testing; Nonvolatile memory; Random access memory; Semiconductor memory; Silicon; Throughput;
