DocumentCode
2379521
Title
Reversi: Post-silicon validation system for modern microprocessors
Author
Wagner, Ilya ; Bertacco, Valeria
Author_Institution
Univ. of Michigan, Ann Arbor, MI
fYear
2008
fDate
12-15 Oct. 2008
Firstpage
307
Lastpage
314
Abstract
Verification remains an integral and crucial phase of todaypsilas microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing time-to-market windows, todaypsilas verification approaches are incapable of fully validating a microprocessor before its release to the public. Increasingly, post-silicon validation is deployed to detect complex functional bugs in addition to exposing electrical and manufacturing defects. This is due to the significantly higher execution performance offered by post-silicon methods, compared to pre-silicon approaches. Validation in the post-silicon domain is predominantly carried out by executing constrained-random test instruction sequences directly on a hardware prototype. However, to identify errors, the state obtained from executing tests directly in hardware must be compared to the one produced by an architectural simulation of the designpsilas golden model. Therefore, the speed of validation is severely limited by the necessity of a costly simulation step. In this work we address this bottleneck in the traditional flow and present a novel solution for post-silicon validation that exposes its native high performance. Our framework, called Reversi, generates random programs in such a way that their correct final state is known at generation time, eliminating the need for architectural simulations. Our experiments show that Reversi generates tests exposing more bugs faster, and can speed up post-silicon validation by 20x compared to traditional flows.
Keywords
instruction sets; integrated circuit design; integrated circuit manufacture; integrated circuit testing; logic design; logic testing; microprocessor chips; Reversi framework; architectural simulation; complex functional bug; constrained-random test instruction sequence; electrical defect; hardware prototype; manufacturing defect; manufacturing process; microprocessor design; post-silicon validation system; verification approach; Automatic testing; Computational modeling; Computer bugs; Hardware; Microprocessors; Prototypes; Silicon; Software testing; System testing; Virtual prototyping;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design, 2008. ICCD 2008. IEEE International Conference on
Conference_Location
Lake Tahoe, CA
ISSN
1063-6404
Print_ISBN
978-1-4244-2657-7
Electronic_ISBN
1063-6404
Type
conf
DOI
10.1109/ICCD.2008.4751878
Filename
4751878
Link To Document