DocumentCode

2379622

Title

"Board test and ITC: what does the future hold?"

Author

Ben, R.G.

Author_Institution

Bennetts Associates

fYear

2002

fDate

2002

Firstpage

1234

Lastpage

1234

Keywords

Automatic testing; Backplanes; Delay; Manufacturing; Packaging; Prototypes; Semiconductor device measurement; Switches; System testing; Technological innovation;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2002. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-7542-4

Type

conf

DOI

10.1109/TEST.2002.1041935

Filename

1041935