DocumentCode
2379673
Title
Is ITC bored with board test?
Author
Butler, Kenneth M.
Author_Institution
Texas Instruments Inc.
fYear
2002
fDate
2002
Firstpage
1237
Lastpage
1237
Keywords
Application specific integrated circuits; Educational institutions; Instruments; Manufacturing; Mobile handsets; Optimized production technology; Standards Board; System-on-a-chip; Telephone sets; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2002. Proceedings. International
ISSN
1089-3539
Print_ISBN
0-7803-7542-4
Type
conf
DOI
10.1109/TEST.2002.1041938
Filename
1041938
Link To Document