Power switch characterization for fine-grained dynamic voltage scaling

Dynamic voltage scaling (DVS) provides power savings for systems with varying performance requirements. One low overhead implementation of DVS uses PMOS power switches to connect DVS blocks to one of the available V_DD supplies. While power switches have been analyzed extensively for leakage power gating, proper design of power switches for DVS is less well understood. This paper characterizes power switches for DVS in terms of V_DD-switching delay and V_DD-switching energy. We show the impact of these switching overheads on a novel fine-grained DVS architecture and present an RC model that allows fast estimation of the overhead. Measurements of a DVS multiplier and adder on a 90 nm CMOS test chip validate the model. Our model and measurements confirm that power switched DVS can provide sufficiently low overhead to give energy savings with only one clock cycle spent at a lower voltage, making this approach a flexible and enticing option for embedded portable systems.