DocumentCode :
2380243
Title :
Efficient Si3H8 Based Deposition Process Suitable for High Throughput Cl2 Based SiCP/SiP Cyclic Deposition and Etch Processes
Author :
Bauer, Matthias ; Goodman, Matthew G. ; Bartlett, Gregory M.
Author_Institution :
ASM America, Phoenix, AZ, USA
fYear :
2012
fDate :
4-6 June 2012
Firstpage :
1
Lastpage :
2
Abstract :
In this paper, an efficient Si3H8, (SiH3CH3, and PH3) based deposition process that can be combined with a Cl2 based selective chemical vapor etch process is demonstrated . Various options for Cl2 based SiCP/SiP processes have been discussed and demonstrated. The most efficient processes are isothermal and isobaric, since temperature or pressure changes add processing time, introduce complexity and potential instabilities. Therefore, in order to maximize process efficiency and stability, the aim is to compose isothermal and isobaric process recipes. Despite the low processing temperature, high growth rates are obtained. Low processing temperature and high growth rate allow high [C] and [P] concentrations. It has been shown that periodic etching as applied in a CDE process does substantially enhance epitaxial layer quality.
Keywords :
chemical vapour deposition; epitaxial layers; etching; silicon compounds; CDE process; SiCP-SiP; deposition process; epitaxial layer quality; growth rates; high throughput based cyclic deposition; isobaric process recipes; isothermal process recipes; low processing temperature; periodic etching; selective chemical vapor etch process; Epitaxial growth; Fluid flow; MOS devices; Silicon; Solids; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon-Germanium Technology and Device Meeting (ISTDM), 2012 International
Conference_Location :
Berkeley, CA
Print_ISBN :
978-1-4577-1864-9
Electronic_ISBN :
978-1-4577-1863-2
Type :
conf
DOI :
10.1109/ISTDM.2012.6222489
Filename :
6222489
Link To Document :
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