DocumentCode :
2380734
Title :
High-performance and damage-free neutral beam etching
Author :
Samukawa, Seiji ; Sakamoto, Keisuke ; Ichiki, Katsunori
Author_Institution :
Inst. of Fluid Sci., Tohoku Univ., Miyagi, Japan
fYear :
2002
fDate :
2002
Firstpage :
126
Lastpage :
129
Abstract :
We propose high efficient neutral beam generation by using negative ions in a neutral beam source. We found that high flux and low energy neutral beams could be generated by efficiently neutralizing negative ions in the pulsed ICP passing through a carbon plate having high aspect ratio apertures. We expect that accurate, damage-free etching processes can be achieved by using our newly developed neutral beam generation system.
Keywords :
plasma sources; sputter etching; damage-free neutral beam etching; high-performance neutral beam etching; negative ion neutralization; neutral beam generation; neutral beam source; pulsed ICP; Acceleration; Apertures; Electrons; Etching; Particle beams; Plasma accelerators; Plasma applications; Plasma measurements; Plasma sources; Plasma x-ray sources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma- and Process-Induced Damage, 2002 7th International Symposium on
Print_ISBN :
0-9651577-7-6
Type :
conf
DOI :
10.1109/PPID.2002.1042625
Filename :
1042625
Link To Document :
بازگشت