Title :
Reusability hypothesis verification using machine learning techniques: a case study
Author :
Mao, Yida ; Sahraoui, Houari A. ; Lounis, Hakim
Author_Institution :
ACD syst. Ltd., Victoria, BC, Canada
Abstract :
Since the emergence of object technology, organizations have accumulated a tremendous amount of object-oriented (OO) code. Instead of continuing to recreate components that are similar to existing artifacts, and considering the rising costs of development, many organizations would like to decrease software development costs and cycle time by reusing existing OO components. This paper proposes an experiment to verify three hypotheses about the impact of three internal characteristics (inheritance, coupling and complexity) of OO applications on reusability. This verification is done through a machine learning approach (the C4.5 algorithm and a windowing technique). Two kinds of results are produced: (1) for each hypothesis (characteristic), a predictive model is built using a set of metrics derived from this characteristic; and (2) for each predictive model, we measure its completeness, correctness and global accuracy
Keywords :
computational complexity; computer aided software engineering; formal verification; inheritance; learning (artificial intelligence); object-oriented programming; software metrics; software reusability; subroutines; C4.5 algorithm; case study; complexity; component reuse; coupling; cycle time; development costs; global accuracy; inheritance; internal characteristics; machine learning techniques; model completeness; model correctness; object technology; object-oriented code; predictive model; software metrics; software reusability hypothesis verification; windowing technique; Application software; Automation; Computer aided software engineering; Costs; Electrical capacitance tomography; Machine learning; Predictive models; Programming; Software reusability; Testing;
Conference_Titel :
Automated Software Engineering, 1998. Proceedings. 13th IEEE International Conference on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-8186-8750-9
DOI :
10.1109/ASE.1998.732582