Title :
A Stochastic Framework for Multiprocessor Soft Real-Time Scheduling
Author :
Mills, Alex F. ; Anderson, James H.
Author_Institution :
Dept. of Stat. & Oper. Res., Univ. of North Carolina at Chapel Hill, Chapel Hill, NC, USA
Abstract :
Prior work has shown that the global earliest-deadline-first (GEDF) scheduling algorithm ensures bounded deadline tardiness on multiprocessors with no utilization loss; therefore, GEDF may be a good candidate scheduling algorithm for soft real-time workloads. However, such workloads are often implemented assuming an average-case provisioning, and in prior tardiness-bound derivations for GEDF, worst-case execution costs are assumed. As worst-case costs can be orders of magnitude higher than average-case costs, using a worst-case provisioning may result in significant wasted processing capacity. In this paper, prior tardiness-bound derivations for GEDF are generalized so that execution times are probabilistic, and a bound on expected (mean) tardiness is derived. It is shown that, as long as the total expected utilization is strictly less than the number of available processors, the expected tardiness of every task is bounded under GEDF. The result also implies that any quantile of the tardiness distribution is also bounded.
Keywords :
multiprocessing systems; processor scheduling; real-time systems; stochastic processes; GEDF; average-case provisioning; bounded deadline tardiness; candidate scheduling algorithm; global earliest-deadline-first scheduling algorithm; in prior tardiness-bound derivations; multiprocessor soft real-time scheduling; soft real-time workloads; stochastic framework; tardiness distribution; utilization loss; wasted processing capacity; worst-case execution costs; worst-case provisioning; Computer science; Costs; Linux; Milling machines; Multicore processing; Operations research; Processor scheduling; Scheduling algorithm; Statistics; Stochastic processes;
Conference_Titel :
Real-Time and Embedded Technology and Applications Symposium (RTAS), 2010 16th IEEE
Conference_Location :
Stockholm
Print_ISBN :
978-1-4244-6690-0
Electronic_ISBN :
1080-1812
DOI :
10.1109/RTAS.2010.33