DocumentCode :
2382275
Title :
Face recognition using a hybrid model
Author :
Wang, Yuheng ; Anderson, Peter G. ; Gaborski, Roger S.
Author_Institution :
Golisano Coll. of Comput. & Inf. Sci., Rochester Inst. of Technol., Rochester, NY, USA
fYear :
2009
fDate :
14-16 Oct. 2009
Firstpage :
1
Lastpage :
8
Abstract :
This paper introduces a hybrid face recognition model that combines biologically inspired features and Local Binary Features. The structure of the model is mainly based on the human visual ventral pathway. Previously, object-centered models focus on extracting global view-invariant representation of faces (I. Biederman, 1987) while feed-forward view-based models (HMAX model by Riesenhuber and Poggio, 1999) extract local features of faces by simulating responses of neurons in the human visual system. In this paper we first review the current main face recognition algorithms: Local Binary Pattern model and R&P model. This is followed by a detailed description of their implementation and advantages in overcoming intra-class variance. Results from our model are compared to the original Riesenhuber and Poggio model and Local Binary Pattern model (T. Ahonen et al, 2005). Then the paper will focus on our hybrid biological model which takes advantages of both structural information and biological features. Our model shows improved recognition rates and increased tolerance to intra-personal view differences.
Keywords :
face recognition; feedforward; image representation; HMAX model; R&P model; feedforward view based model; global view invariant representation; human visual ventral pathway; hybrid biological model; hybrid face recognition model; local binary pattern model; object centered model; Biological system modeling; Biometrics; Computer vision; Eyes; Face detection; Face recognition; Feature extraction; Histograms; Humans; Shape measurement; Biological Feature Detection; Face Recognition; Hybrid Model; Local Binary Pattern;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applied Imagery Pattern Recognition Workshop (AIPRW), 2009 IEEE
Conference_Location :
Washington, DC
ISSN :
1550-5219
Print_ISBN :
978-1-4244-5146-3
Electronic_ISBN :
1550-5219
Type :
conf
DOI :
10.1109/AIPR.2009.5466296
Filename :
5466296
Link To Document :
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