DocumentCode :
2382404
Title :
Modelling technology to predict flip-chip assembly
Author :
Wheeler, D. ; Bailey, C.
Author_Institution :
Centre for Numerical Modelling & Process Anal., Greenwich Univ., London, UK
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
79
Abstract :
This paper describes modelling technology and its use in providing data governing the assembly of flip-chip components. Details are given on the reflow and curing stages as well as the prediction of solder joint shapes. The reflow process involves the attachment of a die to a board via solder joints. After a reflow process, underfill material is placed between the die and the substrate where it is heated and cured. Upon cooling the thermal mismatch between the die, underfill, solder bumps, and substrate will result in a nonuniform deformation profile across the assembly and hence stress. Shape predictions then thermal solidification and stress prediction are undertaken on solder joints during the reflow process. Both thermal and stress calculations are undertaken to predict phenomena occurring during the curing of the underfill material. These stresses may result in delamination between the underfill and its surrounding materials leading to a subsequent reduction in component performance and lifetime. Comparisons between simulations and experiments for die curvature will be given for the reflow and curing process
Keywords :
delamination; encapsulation; flip-chip devices; microassembling; reflow soldering; solidification; component performance; curing; delamination; die curvature; flip-chip assembly; modelling technology; nonuniform deformation profile; reflow soldering; shape predictions; solder joint shapes; stress prediction; thermal mismatch; thermal solidification; underfill material; Assembly; Cooling; Curing; Delamination; Lead; Predictive models; Semiconductor device modeling; Shape; Soldering; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1089-9870
Print_ISBN :
0-7803-5912-7
Type :
conf
DOI :
10.1109/ITHERM.2000.866174
Filename :
866174
Link To Document :
بازگشت