Measurement of dielectric material properties using coupled biconical resonators

Author

Drobakhin, O.O. ; Andreev, Mikhail V. ; Saltykov, Dmitry Yu

Author_Institution

Appl. & Comput. Radiophys. Dept., Oles Honchar Dnipropetrovsk Nat. Univ., Dnipropetrovsk, Ukraine

fYear

2014

fDate

16-18 June 2014

Firstpage

1

Lastpage

4

Abstract

The paper considers the advantages of using coupled biconical resonators in microwave measurement of dielectrics. The advantage of technique is application of resonance frequency of empty resonator as reference one and replacement of Q-factor measurement by measurements of the ratio of amplitudes of maxima of frequency transmission coefficient.

Keywords

dielectric materials; dielectric measurement; dielectric resonators; frequency measurement; microwave measurement; Q-factor measurement; coupled biconical resonator; dielectric material property measurement; frequency measurement; frequency transmission coefficient; maxima amplitude measurement; microwave measurement; resonance frequency; Cavity resonators; Dielectric measurement; Dielectrics; Frequency measurement; Microwave measurement; Q-factor; Resonant frequency; Biconical resonator; Q-factor; permittivity; resonance frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwaves, Radar, and Wireless Communication (MIKON), 2014 20th International Conference on

Conference_Location

Gdansk

Print_ISBN

978-617-607-553-0

Type

conf

DOI

10.1109/MIKON.2014.6900005

Filename

6900005