• DocumentCode
    2382630
  • Title

    Technical maturity evaluations for sensor fusion technologies

  • Author

    Engle, Mike ; Sarkani, Shahram ; Mazzuchi, Thomas

  • Author_Institution
    George Washington Univ., Washington, DC, USA
  • fYear
    2009
  • fDate
    14-16 Oct. 2009
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The National Geospatial-Intelligence Agency (NGA) routinely works with commercial and academic partners to develop and refine technologies needed to meet the evolving imagery-based intelligence problems of the intelligence community (IC). There is an existing Research and Development entity within the NGA which includes the systems engineering framework required to incorporate, develop and transition applicable technologies for use by analysts. In order to better understand where work may fall within this framework, it is necessary to identify the inherent technical maturity of the research in question. Technology Readiness Levels (TRLs), which were originally developed by NASA and are used by the DOD for most development and procurement programs, are used by NGA as a quick indication of both technical maturity and inherent risk (technical, schedule, cost or transition). This paper discusses the different GEOINT-focused performance evaluations pertinent to the TRLs then provides a brief introduction to an applicable multi-sensor data fusion framework.
  • Keywords
    military computing; sensor fusion; GEOINT-focused performance evaluation; National Geospatial-Intelligence Agency; Research and Development; imagery-based intelligence; intelligence community; multisensor data fusion; schedule risk; sensor fusion technology; technical maturity evaluation; technical risk; technology readiness level; transition cost; Costs; Intelligent sensors; NASA; Procurement; Research and development; Sensor fusion; Sensor phenomena and characterization; Space technology; Systems engineering and theory; US Department of Defense;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applied Imagery Pattern Recognition Workshop (AIPRW), 2009 IEEE
  • Conference_Location
    Washington, DC
  • ISSN
    1550-5219
  • Print_ISBN
    978-1-4244-5146-3
  • Electronic_ISBN
    1550-5219
  • Type

    conf

  • DOI
    10.1109/AIPR.2009.5466319
  • Filename
    5466319