DocumentCode
2382698
Title
Large-scale functional models of visual cortex for remote sensing
Author
Brumby, Steven P. ; Kenyon, Garrett ; Landecker, Will ; Rasmussen, Craig ; Swaminarayan, Sriram ; Bettencourt, Luís M A
Author_Institution
Los Alamos Nat. Lab., Los Alamos, NM, USA
fYear
2009
fDate
14-16 Oct. 2009
Firstpage
1
Lastpage
6
Abstract
Neuroscience has revealed many properties of neurons and of the functional organization of visual cortex that are believed to be essential to human vision, but are missing in standard artificial neural networks. Equally important may be the sheer scale of visual cortex requiring ~1 petaflop of computation, while the scale of human visual experience greatly exceeds standard computer vision datasets: the retina delivers ~1 petapixel/year to the brain, driving learning at many levels of the cortical system. We describe work at Los Alamos National Laboratory (LANL) to develop large-scale functional models of visual cortex on LANL´s Roadrunner petaflop supercomputer. An initial run of a simple region V1 code achieved 1.144 petaflops during trials at the IBM facility in Poughkeepsie, NY (June 2008). Here, we present criteria for assessing when a set of learned local representations is ¿complete¿ along with general criteria for assessing computer vision models based on their projected scaling behavior. Finally, we extend one class of biologically-inspired learning models to problems of remote sensing imagery.
Keywords
computer vision; image recognition; neural nets; remote sensing; artificial neural networks; computer vision datasets; cortical system; functional organization; human vision; large scale functional models; neuroscience; remote sensing; remote sensing imagery; retina delivers; roadrunner petaflop supercomputer; visual cortex; Artificial neural networks; Biological system modeling; Brain modeling; Computer vision; Humans; Large-scale systems; Neurons; Neuroscience; Remote sensing; Standards organizations;
fLanguage
English
Publisher
ieee
Conference_Titel
Applied Imagery Pattern Recognition Workshop (AIPRW), 2009 IEEE
Conference_Location
Washington, DC
ISSN
1550-5219
Print_ISBN
978-1-4244-5146-3
Electronic_ISBN
1550-5219
Type
conf
DOI
10.1109/AIPR.2009.5466323
Filename
5466323
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