Title :
Thermomechanical diagnostics of BGA packages using digital image/speckle correlation
Author :
Zhou, Peng ; Goodson, Ken
Author_Institution :
Dept. of Mech. Eng., Stanford Univ., CA, USA
Abstract :
Thermomechanical diagnostic techniques are required for the characterization and reliability engineering of electronic packaging. Digital image/speckle correlation (DISC) is attractive for large throughput testing because it eliminates the specimen grating required by moire interferometry and does not require coherent illumination. Problems of DISC include a larger sensitivity to noise and a reduction of sensitivity for large fields of view. The present work uses DISC to study thermomechanical deformations of solder-joints in a cross-sectioned ball grid array (BGA) thermal test package. An iterative algorithm is developed to calculate the in-plane deformation and strain. Frame averaging of digital images reduces the noise, while a scanning stage allows a large effective field of view with acceptable sensitivity. This work achieves a spatial resolution of 2 μm and a sensitivity of 0.01 pixels. Average strains in these solder joints are also calculated to provide data for fatigue lifetime estimation. The approach demonstrated here is promising for on-line thermomechanical diagnostics in IC manufacturing
Keywords :
ball grid arrays; fatigue testing; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; production testing; soldering; speckle; BGA packages; DISC; IC manufacturing; cross-sectioned ball grid array; digital image/speckle correlation; electronic packaging; fatigue lifetime estimation; frame averaging; in-plane deformation; large throughput testing; reliability engineering; sensitivity; solder-joints; spatial resolution; thermomechanical deformations; thermomechanical diagnostics; Capacitive sensors; Digital images; Electronic packaging thermal management; Electronics packaging; Noise reduction; Reliability engineering; Speckle; Testing; Thermomechanical processes; Throughput;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5912-7
DOI :
10.1109/ITHERM.2000.866197