• DocumentCode
    2382860
  • Title

    Estimation of the thermal-mechanical fatigue behavior of Sn/Pb solder joints

  • Author

    Wang, Xi-Shu ; Yu, Shou-Wen ; Kawagoishi, Norio

  • Author_Institution
    Dept. of Solid Mech., Tsinghua Univ., Beijing, China
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    263
  • Abstract
    The thermal-mechanical fatigue tests were carried out at the different temperatures, axial push pull loading and both coupling cases. So that investigate the fatigue stress and/or strain in surface of specimens for Sn/Pb solder joints. Moreover, the relationship between the thermal-mechanical cyclic stress and strain were discussed for estimation the fatigue stress/strain as well as fatigue crack growth rate. According to the results of the thermal-mechanical strain to be analyzed, the thermal-mechanical fatigue stress or strain can be nearly estimated by the experimental results. And the fatigue crack growth rate can also be expressed by the term Δεeqp. l using the measured strain range under the disproportional loading of thermal-mechanical coupling. The results were compared with both 62Sn38Pb and 62Sn36Pb2Ag in different experimental data. On the other hand, experimentally obtained the either thermal, mechanical or both coupling fatigue crack growth rate can be evaluated based on the small crack growth law, for many electronic solder joints materials. It is possible that thermal-mechanical fatigue crack growth rate the solder joints or/and fatigue life easily and practically predicted based on the small crack growth law
  • Keywords
    fatigue; fatigue cracks; lead alloys; soldering; thermal stress cracking; tin alloys; Sn-Pb; Sn/Pb solder joint; electronic packaging; fatigue crack growth; fatigue strain; fatigue stress; thermal-mechanical fatigue; Capacitive sensors; Fatigue; Life estimation; Soldering; Strain measurement; Temperature; Testing; Thermal loading; Thermal stresses; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1089-9870
  • Print_ISBN
    0-7803-5912-7
  • Type

    conf

  • DOI
    10.1109/ITHERM.2000.866201
  • Filename
    866201