Title :
Finite-element modeling of thermal and thermomechanical behavior for three-dimensional packaging of power electronics modules
Author :
Wen, Simon ; Lu, Guo-Quan
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
The goal of realizing highly efficient and highly reliable energy conversion from source to load in power electronics has driven the exploration of thermal handling of power packaging to the 3rd dimension. Innovative 3-D interconnected power package designs have shown their advantages in higher power density, reduced interconnect resistance, noise and parasitic oscillations, better thermal management, higher level of system integration and lower cost. On the other hand, the complicated design and the fabrication process introduce more reliability concerns. 3-D design of power packaging has not yet been fully understood in its thermomechanical reliability. A detailed study in this respect will help in understanding the key issues of thermal management and thermomechanical reliability. In this work, we present a 3-D finite-element modeling of thermal and thermomechanical performance for a 3-D packaged power module fabricated by a stacked-plate processing technique. Thermal cycles simulating working conditions were applied to the model. Parametric study of interconnection geometry and cooling condition led to better understanding in thermal management, and the results are compared with those of a wire bond module. Thermally induced stresses and fatigue were also analyzed in detail
Keywords :
cooling; fatigue; finite element analysis; power semiconductor devices; semiconductor device packaging; semiconductor device reliability; thermal management (packaging); thermal stresses; 3D interconnected power package designs; cooling condition; fatigue; finite-element modeling; interconnect resistance; interconnection geometry; parasitic oscillations; power density; power electronics modules; reliability concerns; stacked-plate processing technique; system integration; thermal behavior; thermal management; thermally induced stresses; thermomechanical behavior; three-dimensional packaging; Electronic packaging thermal management; Energy conversion; Finite element methods; Power system interconnection; Power system management; Power system reliability; Thermal management; Thermal resistance; Thermal stresses; Thermomechanical processes;
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-5912-7
DOI :
10.1109/ITHERM.2000.866207