• DocumentCode
    2382933
  • Title

    Immersion-cooled heat sinks for electronics: insight from high-speed photography

  • Author

    Bhavnani, Sushil H. ; Fournelle, Gilbert ; Jaeger, Richard C.

  • Author_Institution
    Dept. of Mech. Eng., Auburn Univ., AL, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    310
  • Abstract
    The development of effective heat sinks for the primary heat-dissipating component of a typical portable electronics device is an ongoing challenge. Thermal management using air-cooling is limited by the inherently poor thermal properties of the coolant. Other alternatives, including liquid immersion cooling, phase-change materials, and heat pipes, may merit consideration if the basic mechanisms can be reliably predicted. This study sheds light on the nucleation characteristics of an etched cavity-enhanced surface for use in an immersion-cooled heat sink. The target application is a high-density multi-chip module with several heat dissipating sources. High-speed photography was used to record parameters such as bubble interactions, bubble size, departure frequency and active site density while varying the cavity spacing and heat flux. The cavities, which are approximately 40 μm, are arranged in a square cluster 12.7 mm on each side. It was determined that the contribution of latent heat as a heat dissipation mechanism is only minor (less than 16%). In addition, it is proposed that the latent heat dissipation percentage may be used as a thermal performance indicator. Interactions between neighboring heat sources were also studied. These interactions decreased the bubble departure frequency and thereby affected the latent heat contribution
  • Keywords
    cooling; heat sinks; high-speed optical techniques; multichip modules; photographic applications; thermal management (packaging); 40 micron; active site density; bubble interactions; bubble size; cavity spacing; departure frequency; etched cavity-enhanced surface; heat dissipating sources; heat dissipation mechanism; heat flux; high-density multi-chip module; high-speed photography; immersion-cooled heat sinks; latent heat; nucleation characteristics; portable electronics device; thermal management; thermal performance indicator; Frequency; Heat sinks; Immersion cooling; Mechanical engineering; Photography; Rough surfaces; Surface roughness; Surface treatment; Testing; Thermodynamics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1089-9870
  • Print_ISBN
    0-7803-5912-7
  • Type

    conf

  • DOI
    10.1109/ITHERM.2000.866208
  • Filename
    866208