DocumentCode
2382999
Title
Solder reflow prediction of hybrid pad packaging system
Author
Chiang, Kuo-Ning ; Liu, Chang-Ming
Author_Institution
Dept. of Power Mech. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume
2
fYear
2000
fDate
2000
Firstpage
340
Abstract
In this work, a methodology of solder reflow geometry prediction for hybrid-pad-shapes (HPS) system is developed. In the reflow process, many parameters will influence the final joint shapes and there is no accurate closed-form solution for non-axisymmetric type solder pad prediction such as elliptical and rectangular pads. However, conventional approach like energy-based simulation model for predicting geometries in multiple/hybrid joint arrays is very difficult and time consuming. This work presents an approach combining the analytical and the energy-based methods and is capable of solving any kind of HPS system, such as round, elliptical, and rectangular pads. Furthermore, a detailed geometry information of the solder joints can be transferred to any conventional pre-processor/solver such as MSC/PATRAN, MSC/NASTRAN, LS-DYNA3D, ABAQUS and ANSYS for reliability analyses. The objective of this work for predicting multiple/hybrid solder reflow geometries in ball grid array type interconnects is to achieve optimal joint geometries from the standpoint of improved yield and better reliability cycles under thermal loading. Furthermore, results presented in this study can be used as a reference for area array interconnects design
Keywords
ball grid arrays; circuit reliability; flip-chip devices; hybrid integrated circuits; integrated circuit packaging; multichip modules; reflow soldering; BGA type interconnects; analytical method; area array interconnects design; ball grid array type; elliptical pads; energy-based method; hybrid pad packaging system; joint shapes; optimal joint geometries; rectangular pads; reflow geometry prediction; reliability; reliability analyses; round pads; solder reflow prediction; Closed-form solution; Electronics packaging; Information analysis; Information geometry; Predictive models; Semiconductor device modeling; Shape; Soldering; Solid modeling; Thermal loading;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
Conference_Location
Las Vegas, NV
ISSN
1089-9870
Print_ISBN
0-7803-5912-7
Type
conf
DOI
10.1109/ITHERM.2000.866212
Filename
866212
Link To Document