Title :
Published by the Electron Devices Society of the Institute of Electrical and Electronics Eengineers, Inc. [Copyright notice]
Abstract :
The following topics are dealt with: nanotechnology; device physics; microsystem technology; power devices; power IC; opto device; microwave device; reliability physics; circuit design and circuit testing.
Keywords :
circuit reliability; circuit testing; micromechanical devices; microwave devices; nanotechnology; network synthesis; optoelectronic devices; power integrated circuits; circuit design; circuit testing; device physics; microsystem technology; microwave device; nanotechnology; opto device; power IC; power device; reliability physics;
Conference_Titel :
Microelectronics (MIEL), 2012 28th International Conference on
Conference_Location :
Nis
Print_ISBN :
978-1-4673-0237-1
DOI :
10.1109/MIEL.2012.6222782
