DocumentCode
2383371
Title
Empirical power MOSFET modeling: practical characterization and simulation implantation
Author
Verneau, G. ; Aubard, L. ; Crébier, J-C ; Schaeffer, C. ; Schanen, J.-L.
Author_Institution
Lab. d´´Electrotechnique, CNRS, Grenoble, France
Volume
4
fYear
2002
fDate
13-18 Oct. 2002
Firstpage
2425
Abstract
This study deals with power MOSFET models. Parasitic capacitors are one of the main parameters for dynamic models, and have a critical influence on switching waveforms and switching losses. Most of classical models consider that these capacitors are one-voltage dependent. The aim of this paper is to present a new insight based on a physical structure analysis of charge locations and moves and electrical waveforms, both during switching transitions. Establishment of the model with respect to critical voltage changes is presented, and results are compared with experimental curves. This model appears to be more accurate and more reliable than PSPICE or manufacturer original models.
Keywords
SPICE; capacitance measurement; capacitors; electrodes; field effect transistor switches; power MOSFET; semiconductor device models; PSPICE compatible model; charge locations; critical voltage changes; dynamic models; electrical waveforms; inter-electrodes capacitances; parasitic capacitors; power MOSFET modeling; switching losses; switching transitions; switching waveforms; Capacitors; MOSFET circuits; Parasitic capacitance; Power MOSFET; Power system modeling; SPICE; Switching loss; Testing; Virtual manufacturing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the
Conference_Location
Pittsburgh, PA, USA
ISSN
0197-2618
Print_ISBN
0-7803-7420-7
Type
conf
DOI
10.1109/IAS.2002.1042785
Filename
1042785
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