• DocumentCode
    2383574
  • Title

    Microwave power amplifiers fabricated from wide bandgap semiconductor transistors

  • Author

    Trew, R.J.

  • Author_Institution
    Res., U.S. Dept. of Defense, Arlington, VA, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    577
  • Abstract
    The microwave performance of transistors fabricated from SiC and GaN-based semiconductors is described. It is demonstrated that these devices make possible microwave power amplifiers with superior RF power performance compared to devices fabricated from Si or GaAs. Room temperature RF output power on the order of 4 W/mm and 10-12 W/mm with near ideal power-added efficiency is available from 4H-SiC MESFET´s and GaN-based HFET´s, respectively. These devices are likely to find application in power amplifiers for base station transmitters for cellular telephone systems, HDTV transmitters, power modules for phased-array radars, and other applications. The devices are particularly attractive for applications that require high RF output power and operation at elevated temperature
  • Keywords
    MESFET circuits; gallium compounds; high-temperature electronics; microwave field effect transistors; microwave power amplifiers; microwave power transistors; power MESFET; power field effect transistors; silicon compounds; wide band gap semiconductors; 4H-SiC MESFET; GaN; GaN-based HFET; GaN-based semiconductors; HDTV transmitters; SiC; SiC semiconductor; base station transmitters; elevated temperature operation; high RF output power; microwave power amplifiers; microwave power performance; phased-array radars; power modules; wide bandgap semiconductor transistors; Microwave amplifiers; Microwave devices; Microwave transistors; Photonic band gap; Power amplifiers; Power generation; Radio frequency; Radiofrequency amplifiers; Temperature; Transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics Conference, 1999. SBMO/IEEE MTT-S, APS and LEOS - IMOC '99. International
  • Conference_Location
    Rio de Janeiro
  • Print_ISBN
    0-7803-5807-4
  • Type

    conf

  • DOI
    10.1109/IMOC.1999.866247
  • Filename
    866247