Time domain testing strategies and fault diagnosis for analog systems

An efficient approach is presented for functional testing and parameter estimation of analog circuits in the time domain. The test equations are based on the sensitivity matrix, which can be obtained simultaneously with the nominal solution vector. Two examples (an amplifier-attenuator network and a bandpass filter) are given, with results based on actual measurement data. Practical considerations, including the effects of ambiguity groups, measurement errors, and time skew, are covered. The approach can be directly extended to nonlinear circuits