• DocumentCode
    2383971
  • Title

    A new approach to feature extraction for wavelet-based texture classification

  • Author

    Mittelman, Roni ; Porat, Moshe

  • Author_Institution
    Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
  • Volume
    3
  • fYear
    2005
  • fDate
    11-14 Sept. 2005
  • Abstract
    A new class of features for wavelet-based texture classification is introduced using a new feature-weighting scheme adapted to non-Euclidean similarity measures. The feature extraction is based on the histogram of the local second moment estimates of the wavelet transform. It is shown that the bins´ centers of such histograms should be scaled logarithmically rather than linearly. The distance between two texture features is measured using the x2 similarity measure, weighted according to the feature´s degree of dispersion within the training dataset. Classification experiments of the proposed approach using an orthonormal wavelet transform show improved classification results compared to presently available methods.
  • Keywords
    feature extraction; image classification; image texture; wavelet transforms; feature extraction; feature-weighting scheme; local second moment; nonEuclidean similarity measures; training dataset; wavelet transform; wavelet-based texture classification; Feature extraction; Filtering; GSM; Hidden Markov models; Higher order statistics; Histograms; Maximum likelihood estimation; Smoothing methods; Statistical distributions; Wavelet transforms;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing, 2005. ICIP 2005. IEEE International Conference on
  • Print_ISBN
    0-7803-9134-9
  • Type

    conf

  • DOI
    10.1109/ICIP.2005.1530595
  • Filename
    1530595