DocumentCode
2383971
Title
A new approach to feature extraction for wavelet-based texture classification
Author
Mittelman, Roni ; Porat, Moshe
Author_Institution
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Volume
3
fYear
2005
fDate
11-14 Sept. 2005
Abstract
A new class of features for wavelet-based texture classification is introduced using a new feature-weighting scheme adapted to non-Euclidean similarity measures. The feature extraction is based on the histogram of the local second moment estimates of the wavelet transform. It is shown that the bins´ centers of such histograms should be scaled logarithmically rather than linearly. The distance between two texture features is measured using the x2 similarity measure, weighted according to the feature´s degree of dispersion within the training dataset. Classification experiments of the proposed approach using an orthonormal wavelet transform show improved classification results compared to presently available methods.
Keywords
feature extraction; image classification; image texture; wavelet transforms; feature extraction; feature-weighting scheme; local second moment; nonEuclidean similarity measures; training dataset; wavelet transform; wavelet-based texture classification; Feature extraction; Filtering; GSM; Hidden Markov models; Higher order statistics; Histograms; Maximum likelihood estimation; Smoothing methods; Statistical distributions; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing, 2005. ICIP 2005. IEEE International Conference on
Print_ISBN
0-7803-9134-9
Type
conf
DOI
10.1109/ICIP.2005.1530595
Filename
1530595
Link To Document