Title :
Photoelectric Characteristics and Equivalent Circuit Analysis of Flexible Tungsten Oxide Electrochromic Thin Film
Author :
Jung-Chuan Chou ; Pei-An Ho ; Cheng-Jung Yang ; Yi-Hung Liao
Author_Institution :
Grad. Sch. of Electron. & Optoelectron. Eng., Nat. Yunlin Univ. of Sci. & Technol., Douliou, Taiwan
Abstract :
The tungsten oxide (WO1-x) was deposited by cyclic voltammery on indium tin oxide (ITO)/polyethylene terephthalate (PET) substrate in different deposition cycles. The different deposition cycles were analyzed for energy dispersive spectrum (EDS), optical characteristic, surface morphology, life time, cyclic voltammery, and electrochemical impedance spectroscopy (EIS). The optical characteristic was measured for transmittance variation and coloration efficiency, the surface morphologies were measured for the WO1-x thin-film thickness and roughness, and EIS was measured for the transfer impedance. The electrochromic behaviors of the WO1-x thin film were performed in a 0.1 M lithium perchlorate/propylene carbonate (LiClO4/PC) electrolyte. When the deposition cycles were 50 cycles, the WO1-x thin film had the highest transmittance variation (ΔT650 nm=79.54%), the thickness was 318.26 nm, the transfer impedance was 70.51 Ω, and the thin film can cycle for 124 times.
Keywords :
X-ray chemical analysis; electrochemical impedance spectroscopy; electrochromism; electrodeposition; electrolytes; equivalent circuits; infrared spectra; photoelectricity; surface morphology; surface roughness; thin films; tungsten compounds; ultraviolet spectra; visible spectra; voltammetry (chemical analysis); EDS; ITO; ITO-PET substrate; UV-visible-infrared optical transmittance spectra; WO1-x; coloration efficiency; cyclic voltammetry; electrochemical impedance spectroscopy; electrochromic behavior; energy dispersive spectra; equivalent circuit analysis; flexible tungsten oxide electrochromic thin film; indium tin oxide-polyethylene terephthalate substrate; life time; lithium perchlorate-propylene carbonate electrolyte; optical properties; photoelectric characteristics; size 318.26 nm; surface morphology; surface roughness; thin film thickness; transfer impedance; Impedance; Indium tin oxide; Optical variables measurement; Positron emission tomography; Substrates; Surface impedance; Surface morphology; Cyclic vltammetry; electrochemical impedance spectroscopy; energy dispersive spectrum; polyethylene terephthalate; transmittance variation; tungsten oxide;
Journal_Title :
Display Technology, Journal of
DOI :
10.1109/JDT.2014.2323408