Title :
A Support Vector Machine Based Method for Credit Risk Assessment
Author :
Xu, Wei ; Zhou, Shenghu ; Duan, Dongmei ; Chen, Yanhui
Author_Institution :
Lab. of Data Eng. & Knowledge Eng., Renmin Univ. of China, Beijing, China
Abstract :
The credit card industry has been growing rapidly in recent years, and credit risk assessment becomes critically important for financial companies. In this paper, a novel support vector machine (SVM) based ensemble model is proposed for credit risk assessment. In the proposed method, principles component analysis (PCA) is firstly employed for credit feature selection. Secondly, SVMs with different kernels are trained by using genetic algorithm (GA) to optimize the parameters, and the corresponding assessment results are obtained. Thirdly, all results produced by different SVMs are combined by several ensemble strategies. Finally, an optimal ensemble strategy is selected for credit scoring. For validation, two real world credit datasets are used to test the effectiveness and efficiency of our proposed method. The experiment results find that our proposed ensemble model outperforms commonly used credit scoring tools. The findings of the study reveal the support vector machine based ensemble method to be a promising alternative for credit scoring.
Keywords :
credit transactions; genetic algorithms; principal component analysis; risk management; support vector machines; SVM based ensemble model; credit card industry; credit feature selection; credit risk assessment; credit scoring tool; financial company; genetic algorithm; optimal ensemble strategy; principle component analysis; support vector machine; Artificial neural networks; Classification algorithms; Gallium; Genetic algorithms; Kernel; Risk management; Support vector machines; credit risk assessment; credit scoring; ensemble method; support vector machine;
Conference_Titel :
e-Business Engineering (ICEBE), 2010 IEEE 7th International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-4244-8386-0
Electronic_ISBN :
978-0-7695-4227-0
DOI :
10.1109/ICEBE.2010.44