Title :
International intercomparison of silicon density standards
Author :
Bettin, H. ; Glaser, M. ; Spieweck, F. ; Toth, H. ; Sacconi, A. ; Peuto, A. ; Fujii, K. ; Tanaka, M. ; Nezu, Y.
Author_Institution :
Physikalisch Tech. Bundesanstalt, Braunschweig, Germany
Abstract :
In order to obtain a more accurate value for the atomic mass unit u, and thus for the Avogadro constant N/sub A/, the reliability of silicon single crystals´ density values obtained by different measuring techniques was checked by density determinations with four silicon spheres at PTB, IMGC, and NRLM.
Keywords :
atomic mass; constants; density measurement; elemental semiconductors; measurement standards; reliability; silicon; units (measurement); Avogadro constant; IMGC; NRLM; PTB; Si; atomic mass unit; density standards; international intercomparison; measuring techniques; reliability; spheres; Argon; Atomic measurements; Crystals; Density measurement; Laboratories; Measurement standards; Measurement uncertainty; Metrology; Silicon; Volume measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.546669
