Title :
Proceedings of the 2002 Bipolar/BiCMOS Circuits and Technology Meeting (Cat. No.02CH37384)
Keywords :
BiCMOS integrated circuits; bipolar integrated circuits; heterojunction bipolar transistors; integrated circuit modelling; semiconductor device reliability; semiconductor process modelling; BJT circuits; BiCMOS technology; HBT; RF systems; advanced modeling; analog circuit building blocks; high speed circuits; parameter extraction; power technology; process optimization; reliability; substrate modification; thermal effects;
Conference_Titel :
Bipolar/BiCMOS Circuits and Technology Meeting, 2002. Proceedings of the 2002
Conference_Location :
Minneapolis, MN, USA
Print_ISBN :
0-7803-7561-0
DOI :
10.1109/BIPOL.2002.1042877
